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ENGINEER - DEMQRA COMPUTE RTD at Micron Technology
Tlaquepaque, jalisco, Mexico -
Full Time

Start Date

Immediate

Expiry Date

28 Jan, 26

Salary

0.0

Posted On

30 Oct, 25

Experience

2 year(s) or above

Remote Job

Yes

Telecommute

Yes

Sponsor Visa

No

Skills

Stress Flows, Characterization Flows, Debugging, Test Procedures, Collaboration, Reliability Testing, Data Analysis, Cross-Functional Teams, Analytical Skills, Device Physics, Circuit Analysis, Programming Languages, Reliability Methodologies, Characterization Techniques, Quality Issues, Root Cause Analysis

Industry

Semiconductor Manufacturing

Description
Review new design specifications and generate stress and characterization flows. Debug issues encountered during flow development and optimize test procedures. Collaborate with other departments to implement new stress and characterization methods. Analyze reliability test data to verify accuracy and identify relevant failures. Work with cross-functional teams to prioritize and resolve qualification-related failures. Bachelor's degree in Electrical, Electronic or Computer Engineering or equivalent experience. 3-5 years of experience in test development. 3-5 years of experience in the semiconductor industry. Proficiency in Microsoft Office applications. Experience with both low-level and high-level programming languages. Working knowledge of semiconductor device physics and circuit analysis. Experience developing reliability methodologies for memory products. Familiarity with advanced characterization techniques and tools. Ability to collaborate across design, process, test, and reliability engineering teams. Strong analytical skills for interpreting device data and identifying root causes. Proven track record in solving complex quality and reliability issues.
Responsibilities
The engineer will review new design specifications and generate stress and characterization flows while debugging issues and optimizing test procedures. They will collaborate with other departments to implement new methods and analyze reliability test data to identify failures.