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Senior / Staff Engineer - GaN Metrology at Infineon Technologies AG Australia
, , Singapore -
Full Time

Start Date

Immediate

Expiry Date

16 Feb, 26

Salary

0.0

Posted On

18 Nov, 25

Experience

5 year(s) or above

Remote Job

Yes

Telecommute

Yes

Sponsor Visa

No

Skills

GaN Metrology, Material Science, Chemistry, Solid State Physics, MOCVD, Hetero-epitaxy, Material Characterisation, Metrology Techniques, Data Organisation, Data Analysis, Communication Skills, Cross-functional Teams, AFM, TEM, XRD, P/Ellipsometry, FTIR

Industry

Semiconductor Manufacturing

Description
Development and optimisation of metrology techniques for GaN on Si &GaN on Sapphire material systems Performing assessments and tool matching to ensure measurement accuracy and consistency across different tools. Ph.D in Material Science (or) Masters in Material Science / Chemistry/ Solid State Physics with 3+ years of Industry experience (or) Undergraduate degree with 5+ years of Industry experience with focus on III-V Hetero-epitaxy MOCVD material characterisation Hands-on metrology experience (AFM/TEM/XRD/P/Ellipsometry/FTIR) with AlGaN/GaN HEMTs systems on Silicon and Sapphire Substrates (critical requirement) Good understanding of MOCVD based III-V Hetero-epitaxy processes and their impact on material characterisation Expertise in data organisation/data analysis Good communication skills and ability to work with cross-functional teams in a global R&D organisation We are on a journey to create the best Infineon for everyone. This means we embrace diversity and inclusion and welcome everyone for who they are. At Infineon, we offer a working environment characterized by trust, openness, respect and tolerance and are committed to give all applicants and employees equal opportunities. We base our recruiting decisions on the applicant´s experience and skills.

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Responsibilities
The role involves the development and optimization of metrology techniques for GaN on Si and GaN on Sapphire material systems. Additionally, it includes performing assessments and tool matching to ensure measurement accuracy and consistency across different tools.