SPECIFIC EXPERIENCE

• BS/MS in ECE/EE and at least 10 years of experience in DFT implementation.
• Skilled in different types of DFT structures, including scan (Stuck-At, At-Speed, Path-Delay), scan compression, boundary scan and MBIST.
• Experience in creating and implementing hierarchical DFT architecture in complex SoC.
• Experience in Low-Power DFT and MBIST.
• Experience in test time and test coverage analysis for scan and MBIST patterns.
• Experience in working with test engineering team to bring up production test program.
• Extensive knowledge of timing concepts and constraint development.
• Experience in developing scan ATPG and MBIST test benches and simulation in pre/post-layout environments.
• Experience in RTL is required.
• Experience in scripting like Tcl is preferred.
• Experience with GLS (gate level simulation) is preferred.
• Motivated, self-driven engineer with attention to detail.
• Strong verbal and written English communication skills.

• Responsible for scan insertion, boundary scan, MBIST, ATPG for ultra-low power SoC based on subthreshold operation using standard EDA tools.
• Develop and implement low-power DFT architecture and infrastructure.
• Generate structural test vectors, analyse, and improve coverage, test time and test cost.
• Perform pre/post-layout scan and MBIST simulations.
• Work with designers on STA, physical, power and logical issues related to DFT.
• Work with test engineers to bring up test vectors on silicon.
  Requirements: