Start Date
Immediate
Expiry Date
10 Mar, 26
Salary
0.0
Posted On
10 Dec, 25
Experience
0 year(s) or above
Remote Job
Yes
Telecommute
Yes
Sponsor Visa
No
Skills
Yield Enhancement, Failure Analysis, Scanning Electron Microscopy, Transmission Electron Microscopy, Focus Ion Beam, Defect Identification, Physical Analysis, Sample Preparation, Chemical Staining Techniques, Fault Isolation, Real-Time Defect Analysis, Microelectronics, Mechatronics Engineering, Electrical Engineering, Sample De-Processing Techniques, Process Health Monitoring
Industry
Semiconductor Manufacturing