PhD: Computational imaging and metrology through a multimode fiber

at  ARCNL

WORK ACTIVITIES

Optical metrology is a key ingredient of nanolithography, as it enables the characterization of critical features of nanostructures printed on wafers. High-resolution imaging is an essential part of optical metrology: We need to perform fast imaging with the highest spatial resolution through a simple and compact imaging probe.
Computational imaging is a promising new approach for microscopy, as it has the potential to increase the performance of any imaging system beyond the limitations introduced by optical components. Compressive multimode fiber imaging is a novel imaging paradigm that uses a hair-thin multimode fiber and the fact that natural images are sparse on some basis to recover sub-wavelength information.
As a PhD student, you will develop new approaches to sparsity-based subwavelength imaging through optical fibers. New techniques will connect several modern and dynamic research areas that are still unconnected to date: computational imaging, complex wavefront shaping, compressive sensing and metrology. This will enable fast and accurate characterization of 3D multi-layer nanostructures and pave the way for better metrology tools for tomorrow’s nanolithography.

QUALIFICATIONS

You have a PhD in physics and a strong affinity for experiments combined with an interest in computational imaging algorithms with metrology applications. Knowledge of (computational) imaging technology, experimental optics, advanced programming methods and/or semiconductor metrology is considered an advantage. Good verbal and written communication skills in English are required.

Please refer the Job description for details